Primarius 9812DX is an enhanced version of the industry's de-facto standard flicker noise measurement systems 9812D and 9812B. 9812DX sets new records in measurement speed, system resolution and coverage of different types of measurement requirements for flicker noise and random telegraph noise (RTN or RTS). Flicker noise is the dominant noise for deep sub-micron CMOS, bipolar junction transistor (BJT), field effect transistor (FET) and heterojunction bipolar transistor (HBT) devices.
The 9812DX includes an order of magnitude improvement in measurement resolution compared with the legacy systems, and higher voltage tolerance of up to 200V. The 9812DX system provides extended capability to cover extreme conditions such as diode dark current noise, and is the only system in the market that accommodates a complete range of measurement conditions for both high and low impedance devices, with a range of 10Ω-10MΩ.
To meet the challenge of explosive growth of requirements for low frequency noise test in advanced technology node, especially in FinFET technology, 9812DX delivers a significant and innovative improvement in the design of system hardware and software. With a typical noise measurement speed of 10 sec/bias, 9812DX sets a new highspeed record. The 9812DX can be used in conjunction with the Primarius semiconductor parameter testing system FSPro – resulting in a parallel testing framework solution that significantly improves testing efficiency and throughput.
The 9812DX has been adopted by many foundries following 9812B/D, and has become the new golden tool for low frequency noise testing. It is widely used for development of the most advanced semiconductor process technology nodes, from 14 nm and 10nm to 7nm and 5nm.
Proven gold standard:Indispensable tool for many leading foundries & top fabless companies
Ultimate resolution:Multiple built-in LNAs provide the widest impedance matching range
Full device type coverage:All conditions including high voltage and extreme low current
Highest speed:Fast noise measurement speed and efficient statistical noise analysis
Broad technology support:Proven in all technology nodes including 14/10/7/5nm
Process quality evaluation and monitoring for advanced technology (FinFET/FD-SOI/GaN) development
Noise characterization for SPICE model extraction
Process/device evaluation for advanced circuit designs
-- Maximum Terminal Voltages and Currents: 200V, 200mA
-- System Noise Current Resolution:<10-27A2/Hz
-- 10 sec/bias for typical device 1/f noise
-- DUT impedance range from 10Ω to 10 MΩ
-- 17 Gate/Base options, 15 Drain/Collection options Voltage LNA<0.03-10MHz, 0.65nV/Hz(@5kHz) Current LNA <0.03-1MHz, 0.7pA/ Hz(@5kHz) ESD DUT Protections Built-in ADC and DSA
Please refer to 9812/FS-Pro Technical White Paper for more technical instructions on noise testing/semiconductor parametric testing. https://www.khai-long.com/customers/whitepaper