Generic Semiconductor Parameter Measurement Software


FastLab™  is a generic semiconductor parameter measurement software designed for on-wafer device characterization. FastLab™ implements automated measurement through dynamic interactions with probe stations and instruments.

Key Benefits

  • Supports mainstream instruments and probe stations.

  • Friendly user interface and easy to operate. Comprehensive built-in device list, while also serving customized devices. Various built-in current voltage/capacitance voltage (IV/CV) Spec analyses to simplify the measurement particularly for the fresh user.


  • Accommodates both manual and automated measurement. Capable of loading die and sub-die settings from probe station. Offers manual and auto save of measured data.


  • Highly integrated GUI helps users to quickly set up meters, switching matrix and probe stations. Straightforward device settings via referencing to built-in routines. Convenient for batch-measurements, allows for one-click exporting from and importing to.xls format files. Measured cures can be displayed in multiple ways as per users’ request. Reporting available in pdf/docx/ppt formats.


  • Support dat and xls data file format, compatible with BSIMProPlus and MeqLab modeling tool.


  • Supports generic semiconductor devices for both IV/CV measurements and reliability measurements.

  • Enables either manual or auto on-chip measurements through communication with semi-auto probe stations, effectively switching matrix and IV/CV meters through GPIB.


Supported Instrument List

  • Meter

  • Keysight B1500/HP4284/HP4156/E4980

  • Switching Matrix

  • Keysight E5250A/B2200, Keithley K707

Probe Station

  • Cascade Semi-Auto S300/E300/CM300

  • MPI Semi-Auto TS2000/TS3000


  • Operating System: Windows XP or above

  • Hardware Requirements: Pentium 4-core CPU, 1GB RAM or above