Testing Systems

Comprehensive Low-Frequency Measurement

By integrating leading semiconductor characteristic testing solutions with EDA products, we provide differentiated and higher value data-driven EDA full-process solutions through product collaboration.

Parametric Testing

Noise Measurement

Low-frequency noise testing is a crucial analytical tool in semiconductor device manufacturing and design. It is used to measure the 1/f noise and RTN noise performance of device, which helps Foundries, IDMs and fabless customers improve product quality and competitiveness. Foundries and IDMs can monitor and optimize process, while IC designers can evaluate and validate device noise characteristics to optimize circuit design for improved performance and reliability.


The Primarius 981X series low-frequency noise testing system is the gold standard in the low-frequency noise testing field. It is suitable for advanced process development, IC design, and academic research from mature processes to 28/14/10/5/3nm process nodes. Additionally, the 9812AC is the industry's first commercially available AC noise testing system which offers more possibilities for exploring new semiconductor research fields.


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