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Power Device Design Verification

Rdson Extraction Gate Delay Analysis Electro-thermal Analysis

PTM is a suite of tools to enhance the design analysis of power device, recognized and adopted by the top-ranking power device IDMs and Fabless companies. It can extract Rdson with high precision and verify the device's switching behavior, ensuring the product's reliability and lifespan. 

    • Utilizing the edge-based 3D solver, optimizing Rdson and gate delay in power transistor arrays

    • Verifying current density "hot-spots", checking electro-migration violation

    • Optimizing layout and pad placement, detecting missing vias and metal current crowding

    • Extending to power device die, package, and PCB co-simulation, ensuring an optimal thermal performance

    • Integrated with user-friendly results viewer with cross-linked reports and field views

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    • Accurate

      High precision parameter extraction
      and optimization

    • Rich Views

      2D view, solver view,
      and field view

    • Layout Optimization

      Analyze pad
      and via placement

    • Reliability

      Analyze potential issues like electromigration,
      overheating failures, etc.

    • Dynamic Analysis

      Simulation based transient
      ET analysis

    • Switching Behaviour

      Maximize switching


    • Power device
      design analysis(IGBT)

    • Automotive IC
      design analysis

    • Power IC design analysis (PMIC/
      DC-DC converters)

    • Mixed-signal IC
      design analysis

    • Co-optimization of ET performance(in

    • High voltage
      GAN device
      design analysis


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