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Noise Measurement

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9813DXC

Advanced Low Frequency Noise Measurement System

Low Frequency Noise 1/f Noise & RTN High-Accuracy & Wide-Range

9813DXC excels in fast, high-resolution low frequency noise measurement for diverse requirements, helping chip manufacturers identify and eliminate defects for reliable, high-performance chips.

  • Accommodate a complete range of measurement conditions for both high and low impedance devices, ranging from 10Ω to 10MΩ

  • Delivers a significant and innovative improvement in hardware and software design to meet the challenge of explosive growth requirements for low frequency noise test of advanced technology nodes, especially FinFET technology

  • Used in conjunction with the Primarius semiconductor parameter testing system FS-Pro, providing a parallel testing framework solution that significantly improves testing efficiency and throughput

  • Applies for 14/10/7/5nm technology node

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Highlights

  • Ultimate Resolution

    Multiple built-in LNAs
    provide the widest impedance matching range

  • Full Coverage

    MOSFET, SOI, FinFET, TFT, HV/LDMOS, BJT/HBT,
    JFET, Diode, Resistor, Packaged IC, etc.

  • Parallel Testing

    Significantly improve
    testing efficiency and throughput

  • High Speed

    20 sec/bias for typical device 1/f noise

  • Innovative Architecture

    Integrated system architecture

  • Easy-to-Use

    Intuitive touch screen for easy operation

Applications

  • Process development
    quality assessment
    & quality control

  • Noise characterization for SPICE model extraction

  • Design
    performance
    optimization

  • Semiconductor
    physics & materials
    research

Technical Documents

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